Rohde & Schwarz will showcase solutions for power electronics testing at PCIM Europe in Nuremberg from June 11 to 13. At booth 619 in hall 7, products that address the challenges of testing and debugging wide bandgap semiconductors in power electronic converters will be under the spotlight. The company’s experts will share their knowledge of applications, such as inverter drive design, double pulse testing and EMI debugging using the company's test instruments.
Among these are the next generation MXO 5 and MXO 5C series oscilloscopes. The first eight-channel oscilloscopes from the company are based on MXO-EP processing ASIC technology. This technological breakthrough makes it possible to achieve the world’s first real time acquisition rate of 4.5 million waveforms per second, as seen in the MXO 4 series, according to the company. The MXO 5C is the compact version of the MXO 5, but without an integrated display, so it is suitable for rack-mount applications.
Both models support simultaneous real-time acquisition on four channels, processing 18 million waveforms per second. The instruments’ front-end performance and digital trigger approach leverage the 18-bit HD architecture derived from the 12-bit ADC, providing precision in all measurements, noted Rohde & Schwarz. At PCIM Europe, visitors are able to learn how these instruments can help solve complex design challenges.
There will also be a glimpse of a solution for measuring with high common mode voltages at high frequencies. For more information click here.