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Rohde & Schwarz to highlight its newest test solutions at IMS 2025 in San Francisco

Rohde & Schwarz will debut a game-changing analyzer that it says will overcome the limitations of today’s measurement methods, at the IEEE MTT-S International Microwave Symposium (IMS) 2025 in San Francisco from 17–19 June 2025.

With a novel architecture that combines multiple input ports with cross-correlation techniques, the analyzer allows for completely new measurement scenarios in RF system testing. Rohde & Schwarz presents its signal analysis revolution with wider modulation bandwidths and higher modulation orders to conquer the requirements for ever-increasing data rates.

In addition, Rohde & Schwarz will showcase updates for its R&S FSWP, the industry reference for phase noise testing. Besides a frequency range extension, the phase noise analyzer’s capabilities have been expanded for additive and residual phase noise measurements and the support of external high-end sources as local oscillators.

Another highlight at the company’s booth will be the new R&S ZNB3000 vector network analyzer, which is optimized for high-volume production and short ramp-up times. Its scalable design allows for rapid upscaling and easy adaptation to application specific requirements.

At IMS 2025, the company will let exhibition attendees experience RF design workflows in a fun way with the IMS workflow passport challenge. This involves stops at multiple industry partners and a chance to win prizes.