More in

Rohde & Schwarz to appear at Nuremberg embedded tech event

Test equipment and services company Rohde & Schwarz will be showcasing its latest test and measurement solutions for embedded tech at the Embedded World event in Germany next month.

Nuremberg will host the Embedded World event this April. Picture: Pixabay

Tailored to the embedded industry, the Embedded World event will take place in Nuremberg from April 9 to 11, 2024.

Visitors to Rohde & Schwarz’s booth 4-218 in hall 4 of the Nuremberg Exhibition Center will have the opportunity to “gain insights into embedded design testing, including testing of digital designs and interfaces, power electronics, electromagnetic compatibility, wireless connectivity and in-vehicle networks,” the company said.

Among the test solutions that the company will be showcasing will be its CMW wideband radio communication test platform covering the new Low Energy (LE) feature Bluetooth® Channel Sounding (CS).

Another showcased product will be the company’s MXO 5 oscilloscope, “the world’s first eight-channel oscilloscope that can detect 4.5 million acquisitions and a total of 18 million waveforms per second across multiple channels,” Rohde & Schwarz said.

The company will also be offering visitors the chance to learn more about compliance testing for high-speed digital designs.

The company said: “Visitors to the show can learn about powerful tools for system verification and debug, as well as compliance testing for signal integrity in interfaces, PCBs and interconnects, directly from experts in the field.

“Demo setups at the Rohde & Schwarz booth include USB 3.2 signal integrity debugging with receiver equalization emulation and advanced eye diagram analysis with the R&S RTP164B oscilloscope, as well as protocol decoding with the MXO 4 oscilloscope.”

Other test setups will allow visitors to use various smartwatch apps to observe how GPS affects power consumption in real time, and a demonstration test setup of Rohde & Schwarz FSPN high-speed phase noise analyzer up to 50 GHz with a VCO device under test.