Read the October issue of CET&D magazine

The latest issue of Consumer Electronics Test & Development magazine is available to read online with in-depth features and insightful interviews covering the latest in electronics testing and standards.

Among the highlights of the Autumn issue are a feature delving into the impact of generative AI on consumer electronics, and the role testing and certification can play in controlling this powerful new tool. Written by regular contributor Tina Milton, the article features the contributions of experts including Dr Martin Saerbeck, of TÜV SÜD, Nikola Banovic, of the University of Michigan, Adonis Celestine, of Applause and the IEC’s Wael William Diab.

Another feature in the magazine looks at testing and standards around child safety. Written on the back of several high-profile tragedies involving children and electronics, we take a sober look at the vital role testing plays in making electronics child safe, aided by the expert contribution of Steve Hayes and Emily Klein, of Element Materials Testing.

The magazine also features an interview with Yoon Ho Choi, president of the Home Connectivity Alliance and head of IoT at Samsung, to talk about the brave new world of connected home tech. Elsewhere, we discuss the thorny question of gender bias in consumer electronics development with Sonya Bird, director of international standards at UL Standards & Engagement and a member of the IEC/ISO joint strategic advisory group on gender responsive standards.

There’s a great feature exploring the testing, standards and regulatory landscape for the emerging technology of wireless charging, and an insightful article covering the testing of biometrics written by Mankirat Kaur.

The magazine also features contributions from Atlas Materials Testing, CSA Group, UL Solutions, Radiant Vision Systems, Element Materials Technology, Klippel, Zeiss and GRAS.

Read it in full online now.