The company will present a paper for the new system (for which it has a patent pending) at the SPIE AR | VR | MR conference taking place January 23-25 at Moscone West in San Francisco.
The paper will be presented as part of the conference Technical Talks by Eric Eisenberg, Radiant’s optics development manager, and Javier Ruiz, a Radiant optical software engineer.
Display quality for AV, VR and MR devices, known under the umbrella term XR (extended reality) devices, is determined by user perception of the display within the headset parameters. In order to emulate the viewing conditions of the user, most measurement systems evaluate XR display quality by applying optics that position the entrance pupil (aperture) of an imaging lens at the eye position within the headset.
While this viewing position is common across XR displays, because there is no standard guiding XR device design new display measurement equipment must be developed continuously to address the unique viewing conditions of new devices.
To deal with these variables, many XR devices require measurement systems with costly custom optics. Radiant's paper introduces a patent-pending novel optical design that the company claims will greatly simplify the process of building imaging systems for near-eye display (NED) metrology.
According to Radiant, the system uses commercially available modular components to produce a variety of optical configurations that can be reconfigured to match unique specifications of most XR headsets with minimal development time.
Radiant's technical paper and poster presentations will introduce this optical design concept and demonstrate the performance of the modular system for NED measurement, using test data and measurement examples.