According to a report in India’s Financial Express, 64 electronics devices can now be parallel tested including electronics made by Samsung, Apple, Xiaomi, Lenovo and Dell.
For parallel testing device components are simultaneously tested. This is faster than the alternative approach of so-called sequential testing, where component tests are done one after another.
According to the report, for the last year India has been running a pilot project for parallel component testing, as it seeks to moving away from its current system of sequential testing.
Indian industry reportedly said that the switch to parallel testing meant the entire compliance process could now be completed within 4 -13 weeks compared to 16-21 weeks for sequential testing.
The Bureau of Indian Standards (BIS) said in a recent notification on the subject: “Under parallel testing, the lab will test the first component and issue test report. This test report number along with the name of the lab will be mentioned in the test report of the second component. This procedure will be followed for subsequent components and final product also.”
MAIT, an Indian electronics industry body which represents the IT, mobile, datacom and consumer electronics industry, applauded the move by BIS.
“The voluntary adoption of parallel testing not only streamlines the compliance process for manufacturers but also significantly accelerates the go-to-market strategy compared to the traditional sequential testing methodology,” said Suhail Zaidi, director general of MAIT.